If you use this program for a publication please cite any of these papers.

@article {ADMA:ADMA201402028,
author = {Macke, Sebastian and Radi, Abdullah and Hamann-Borrero, Jorge E. and Verna, Adriano and Bluschke, Martin and Brück, 
Sebastian and Goering, Eberhard and Sutarto, Ronny and He, Feizhou and Cristiani, Georg and Wu, Meng and Benckiser, Eva and Habermeier, Hanns-Ulrich and Logvenov, Gennady and Gauquelin, Nicolas and Botton, Gianluigi A. and Kajdos, Adam P. and Stemmer, Susanne and Sawatzky, Georg A. and Haverkort, Maurits W. and Keimer, Bernhard and Hinkov, Vladimir}, 
title = {Element Specific Monolayer Depth Profiling}, 
journal = {Advanced Materials}, 
issn = {1521-4095}, 
url = {http://dx.doi.org/10.1002/adma.201402028}, 
doi = {10.1002/adma.201402028}, 
pages = {n/a--n/a}, 
keywords = {thin film heterostructures, complex functional materials, resonant X-ray reflectivity,  
non-destructive characterization, depth profiling}, 
year = {2014}, 
}

@article{0953-8984-26-36-363201, 
author={S Macke and E Goering}, 
title={Magnetic reflectometry of heterostructures},
journal={Journal of Physics: Condensed Matter},
volume={26},
number={36},
pages={363201},
url={http://stacks.iop.org/0953-8984/26/i=36/a=363201},
year={2014}, 
}