# ReMagX

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documentation:post_modifications

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 documentation:post_modifications [2012/04/05 18:16]142.103.140.43 documentation:post_modifications [2013/04/03 22:21] (current) Both sides previous revision Previous revision 2012/08/31 19:42 macke 2012/04/05 18:16 2011/12/30 21:03 2011/12/30 21:02 2011/12/30 20:59 2011/12/30 20:58 2011/12/30 20:58 2011/12/30 20:50 2011/12/30 20:49 created Next revision Previous revision 2012/08/31 19:42 macke 2012/04/05 18:16 2011/12/30 21:03 2011/12/30 21:02 2011/12/30 20:59 2011/12/30 20:58 2011/12/30 20:58 2011/12/30 20:50 2011/12/30 20:49 created Line 1: Line 1: + One data point for one film can be characterized by the four numbers qz, energy, intensity and type of polarization. + + Dependent on the type of measurement different modifications could be helpful to analyze the data. The program is capable to do this modifications automatically. ​ + + + == Multiply by *qz^4 == + + The two main effects in reflectometry are the reflection and transmission at the interfaces (fresnel equations) and interference. ​ + If you neglect the roughness at the interface the fresnel part is proportional to 1 / qz^4. + Therefore by multiplying the result by qz^4 one can emerge the interference part of the result. ​ + + (TODO: Fit linear if this option is enabled) + + == Divide by /​cos(2*theta)^2 if pi-light == + + The Fresnel formulas between sigma and pi light differ by a factor /​cos(2*theta)^2. If you want to compare the dichroism between sigma- and pi-light you can enable this option. ​ + + == Fourier transformation == + + ​Fourier transforms the spectra to determine the layer thicknesses. + + + == Averaging == + + TODO \\ + +